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The effects of self assembled dot geometry in Auger recombination rates.

By Darren Chaney, Mervyn Roy, P.A. Maksym and F. Long

Abstract

This paper was published in: Physics of semiconductors 2002 : proceedings of the 26th International Conference on the Physics of Semiconductors held in Edinburgh, UK, 29 July-2 August 2002 / edited by A.R. Long and J.H. Davies, published by Institute of Physics, 2003. It is available from http://www.iop.org/Conferences/Conference%20Proceedings/index.htmlMetadata only entr

Publisher: Institute of Physics
Year: 2003
OAI identifier: oai:lra.le.ac.uk:2381/7604
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