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Narrow-band X-ray polarizing filters.

By A. Martindale, N. P. Bannister, K. D. M. Harris, G. A. Solan, S. P. Collins, Y. Champouret, V. K. Muppidi, G. W. Fraser and Mervyn Roy

Abstract

We review past and current attempts to measure X-ray polarization in celestial sources and describe research activity into a new family of materials which have been shown to exhibit linear dichroism at X-ray wavelengths. Such materials could add a polarimetry capability to the high energy resolution detectors proposed for future, high effective area, X-ray astrophysical observatories such as Constellation-X and XEUS. They have the potential to achieve useful minimum detectable polarization values for a number of sources in a sensible exposure time with XEUS

Publisher: Society of Photo-optical Instrumentation Engineers (SPIE)
Year: 2007
DOI identifier: 10.1117/12.734114
OAI identifier: oai:lra.le.ac.uk:2381/7510
Journal:

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