The possibility of using spray pyrolysis as a simple, chemical, low cost method for the production of CeO2 and MgO thin films widely used as buffer layers for second generation coated conductors was examined. CeO2 films were produced on borosilicate glass substrates and four different surface morphologies were observed at different deposition temperatures. The smoothest films were obtained when the process was described as low temperature chemical vapour deposition. In addition, c-axis textured CeO2 films have been deposited on Si (100) single crystal, but the surface morphology was quite rough, consisting of distinct particles indicating that further optimisation is needed. On the other hand c-axis textured MgO films with smooth morphologies were deposited on Si (100) single crystal. Rocking curves revealed an excellent out of plane texture with a FWHM between 0.950 and 1.01
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