The Experiences in Close Relationship Scale (ECR)-Short Form: Reliability, Validity, and Factor Structure

By Meifen Wei, Daniel W. Russell, Brent Mallinckrodt and David L. Vogel

Publisher: 'Informa UK Limited'

Year: 2011

DOI identifier: 10.1080/00223890701268041

OAI identifier:

Provided by: MUCC (Crossref)

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