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Predicting the reference length of polymer parts with micrometer uncertainty measured under non-reference conditions

By A. Mohammadi, M. R. Sonne, G. Dalla Costa, D. González-Madruga, L. De Chiffre and J. H. Hattel
Topics: Creep phenomena, Metrology for polymers, Moisture uptake, Product validation
Publisher: 'Elsevier BV'
Year: 2018
DOI identifier: 10.1016/j.precisioneng.2018.07.003
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