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Atomic and Electrical Characterisation of Amorphous Silicon Passivation Layers

By B.J. O'Sullivan, N.H. Thoan, M. Jivanescu, L. Pantisano, T. Bearda, F. Dross, I. Gordon, V. Afanas’ev, A. Stesmans and J. Poortmans
Publisher: Elsevier BV
Year: 2012
DOI identifier: 10.1016/j.egypro.2012.07.049
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Provided by: MUCC (Crossref)
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