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Evaluating injection and transport properties of organic field-effect transistors by the convergence point in transfer-length method

By Chuan Liu, Yong Xu, Gérard Ghibaudo, Xubing Xu, Takeo Minari and Yong Noh

Abstract

International audienceContact resistance (RC), which dominates the performance of organic field-effect transistors (OFETs), relates multiple factors such as charge injection, transport, and device architecture. Here, we focus on physical meaning of the convergence point in conventional transfer-length method, and clarify the correlation between charge injection and geometrical parameters of OFETs by simulations. We also defined the effect of band-like/hopping transport in semiconductor on the charge injection process, where less hopping transport results in lower and less gate-voltage dependent RC. These results were confirmed by experiments on pentacene OFETs and reveal the values of convergence point in OFET research

Topics: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Publisher: 'AIP Publishing'
Year: 2014
DOI identifier: 10.1063/1.4860958
OAI identifier: oai:HAL:hal-01947594v1
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