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Bacterial stress monitoring with a SOI optical microcavity

By M. Tardif, R. Therisod, E. Picard, P. R. MARCOUX, V. Gaude, J.-B. Jager, R. HoudrÉ and D. Peyrade

Abstract

International audienc

Topics: [PHYS]Physics [physics]
Publisher: HAL CCSD
Year: 2018
OAI identifier: oai:HAL:hal-01930111v1
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