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Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor

By Russell Duane, Quentin Rafhay, M. Florian Beug and Michiel van Duuren

Abstract

International audienc

Topics: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2007
OAI identifier: oai:HAL:hal-01959438v1
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