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III V Si 100 heterointerfaces studied in VPE ambient via surface dimers by in situ reflection anisotropy spectroscopy

By O. Supplie, S. Brückner, H. Doscher, P. Kleinschmidt and T Hannappel
Topics: Others
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2013
DOI identifier: 10.1109/pvsc.2013.6744284
OAI identifier: oai:helmholtz.HZB:94123
Provided by: HZB Repository
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