Magneto-optical Faraday effect probed in a scanning tunneling microscope

Prins, M.W.J.; Wielen, van der, M.C.M.M.; Abraham, D.L.; Kempen, van, H.; Kesteren, van, H.W.

Magneto-optical Faraday effect probed in a scanning tunneling microscope

Authors: M.W.J. Prins
van der, M.C.M.M. Wielen
D.L. Abraham
van, H. Kempen
van, H.W. Kesteren
Publication date: January 1, 1994
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Doi: DOI:10.1109/20.334117

Abstract

Semiconductor tips are used as local photodetectors in a scanning tunneling microscope. We demonstrate that this configuration is sensitive to small light intensity variations, as supported by a simple model. The principle is applied to the detection of Faraday ellipticity of a Pt/Co multilayer sample. The outlook of this new technique in magneto-optical imaging is briefly discussed

info:eu-repo/semantics/article

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