Nanoscience crystallography at a high brilliance laboratory X-ray diffractometer: from mesoscopic to atomic length scales

By Emmanuel Kentzinger, Ulrich Rücker, Asma Qdemat and Thomas Brückel

Year: 2018

OAI identifier: oai:juser.fz-juelich.de:844455

Provided by: Juelich Shared Electronic Resources

Download PDF:
_{Sorry, we are unable to provide the full text but you may find it at the
following location(s):}

http://juser.fz-juelich.de/sea... (external link)

http://juser.fz-juelich.de/rec... (external link)