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X-ray Data collection and refinement statistics.

By Jianbin Ruan (201369), Hui Ouyang (245739), Maria F. Amaya (217043), Mani Ravichandran (326517), Peter Loppnau (273605), Jinrong Min (182610) and Jianye Zang (201398)

Abstract

a<p>The values in parentheses refer to statistics in the highest shell.</p>b<p>Rmerge = |Ii−<i>|/|Ii| where Ii is the intensity of the ith measurement, and <i>is the mean intensity for that reflection.</i></i></p><i><i>c<p>Rwork = Σh|Fo(h)−Fc(h)|/ΣhFo(h), where Fo and Fc are the observed and calculated structure factor amplitudes, respectively.</p>d<p>Rfree was calculated with 10% of the reflections in the test set.</p>e<p>Categories were defined by MolProbity.</p></i></i

Topics: Biophysics, Biochemistry, Genetics, Molecular Biology, refinement
Year: 2013
DOI identifier: 10.1371/journal.pone.0035376.t002
OAI identifier: oai:figshare.com:article/324534
Provided by: FigShare
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