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X-ray Data collection and refinement statistics.

By Jianbin Ruan (201369), Hui Ouyang (245739), Maria F. Amaya (217043), Mani Ravichandran (326517), Peter Loppnau (273605), Jinrong Min (182610) and Jianye Zang (201398)


a<p>The values in parentheses refer to statistics in the highest shell.</p>b<p>Rmerge = |Ii−<i>|/|Ii| where Ii is the intensity of the ith measurement, and <i>is the mean intensity for that reflection.</i></i></p><i><i>c<p>Rwork = Σh|Fo(h)−Fc(h)|/ΣhFo(h), where Fo and Fc are the observed and calculated structure factor amplitudes, respectively.</p>d<p>Rfree was calculated with 10% of the reflections in the test set.</p>e<p>Categories were defined by MolProbity.</p></i></i

Topics: Biophysics, Biochemistry, Genetics, Molecular Biology, refinement
Year: 2013
DOI identifier: 10.1371/journal.pone.0035376.t002
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Provided by: FigShare
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