Article thumbnail
Location of Repository

Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-seeding

By Paul Rosinger, Bashir Al-Hashimi and Nicola Nicolici

Abstract

Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and improving the yield. Our research addresses this problem by proposing a new method which maintains the benefits of mixed-mode built-in self-test (BIST) (low test application time and high fault coverage), and reduces the excessive power dissipation associated with scan-based test. This is achieved by employing dual linear feedback shift register (LFSR) re-seeding and generating mask patterns to reduce the switching activity. Theoretical analysis and experimental results show that the proposed method consistently reduces the switching activity by 25% when compared to the traditional approaches, at the expense of a limited increase in storage requirements

Year: 2002
OAI identifier: oai:eprints.soton.ac.uk:256730
Provided by: e-Prints Soton
Sorry, our data provider has not provided any external links therefore we are unable to provide a link to the full text.

Suggested articles

Citations

  1. (1996). Altering apseudo-random bit sequence for scan-based BIST. doi
  2. (1996). Bit-flipping BIST. doi
  3. (1986). Built-In SelfTest - Pseudorandom Techniques. doi
  4. (1995). Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers. doi
  5. (1991). LFSR-coded test patterns for scan designs.
  6. (2000). Low power testing of VLSI circuits: Problems and solutions. doi
  7. (1999). LT-RTPG: A new test-per-scan BIST TPG for low heat dissipation. doi
  8. (1999). Minimized power consumption for scan-based BIST. In doi
  9. (2000). PowerMinimisation TechniquesforTestingLow Power VLSI Circuits.
  10. (1998). Test data decompression for multiple scan designs with boundary scan. doi

To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.