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A Micro-Pull-Off Test Machine for Reliable Measurement of Adhesive Forces on Micro/Nano-Scale Areas

By S Kim and W Moon



Topics: Adhesive force measurement, Adhesive protein, AFM, Atomic force microscopy, Force map, Micro-pull-off testing
Publisher: 'Informa UK Limited'
Year: 2018
DOI identifier: 10.1080/00218464.2011.545336
OAI identifier:
Provided by: 포항공과대학교
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