A Micro-Pull-Off Test Machine for Reliable Measurement of Adhesive Forces on Micro/Nano-Scale Areas

By S Kim and W Moon

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Topics: Adhesive force measurement, Adhesive protein, AFM, Atomic force microscopy, Force map, Micro-pull-off testing

Publisher: 'Informa UK Limited'

Year: 2018

DOI identifier: 10.1080/00218464.2011.545336

OAI identifier: oai:oasis.postech.ac.kr:2014.oak/25070

Provided by: 포항공과대학교

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