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In situ observation of the evolution of porous silicon interference filter characteristics.

By J. Volk, K. Ferencz, Jeremy J. Ramsden, A. L. Tóth and I. Bársony

Abstract

Porous silicon multilayer formation was observed by in situ monitoring of the reflectivity spectra in the visible range. In order to reproduce the formation process optical model simulation was carried out. For demonstration of this method a 24-layer microcavity structure was selected. Although in this low wavelengths region some absorption and scattering effects complicate the overall picture, the combined analysis throws new light upon the evolution of the porous silicon multilayer

Publisher: Wiley-VCH Verlag GmbH & Co. KGaA
Year: 2005
OAI identifier: oai:dspace.lib.cranfield.ac.uk:1826/977
Provided by: Cranfield CERES

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Citations

  1. (1997). Thin Solid Films 297, doi
  2. (2001). Thin-Film Optical Filters, 3rd edition, doi

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