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Spherical near-field scanning at the Technical University of Denmark

By J. E. Hansen and F. Jensen
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 1988
DOI identifier: 10.1109/8.1174
OAI identifier: oai:pure.atira.dk:publications/2627404d-24a3-45de-be53-cbbfc68e0386

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