Spherical near-field scanning at the Technical University of Denmark
By J. E. Hansen and F. Jensen
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 1988
DOI identifier: 10.1109/8.1174
OAI identifier:
oai:pure.atira.dk:publications/2627404d-24a3-45de-be53-cbbfc68e0386