Skip to main content
Article thumbnail
Location of Repository

Investigation of Influence of Enviromental Conditions to Surface of Antireflective Thin Films

By Janīna Sētiņa, Gundars Mežinskis and vasilijs Akishins

Abstract

This article gives an overview of anti-reflection characterization of SiO2 and TiO2 multilayer thin films on flat glass substrate obtained by magnetron sputtering. Optical properties (refractive index, reflectance, transmission) were determined, and discussed in connection with surface morphology of films studied by means of atomic force microscopy

Topics: anti-reflectance thin films, magnetron sputtering, optical properties
Publisher: China Triumph International Engineering Co., Ltd
OAI identifier: oai:ortus.rtu.lv:12800
Sorry, our data provider has not provided any external links therefore we are unable to provide a link to the full text.

Suggested articles


To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.