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Eddy-current testing with the Expected Improvement optimization algorithm

By Sandor Bilicz, Emmanuel Vazquez, Jozsef Pavo, Marc Lambert and Szabolcs Gyimothy

Abstract

International audienceThis paper presents an inverse problem methodology in the domain of non-destructive testing, and more precisely eddy-current testing. Our objective is to use a precise but expensive-to-evaluate model of the electromagnetic induction phenomenon in a conductive material and to estimate the characteristics of a flaw by minimization of a regularized criterion with the \emph{Expected Improvement (EI)} global optimization algorithm. The EI algorithm is designed to estimate a global optimum of a function with a restricted budget of function evaluations. Thus, we expect to be able to estimate the characteristics of a flaw with a relatively low cost despite resorting to an expensive model of the induction phenomenon. The efficiency of the approach is discussed in the light of preliminary numerical examples obtained using synthetic data

Topics: [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism, [STAT.ME]Statistics [stat]/Methodology [stat.ME]
Publisher: HAL CCSD
Year: 2009
OAI identifier: oai:HAL:hal-00446202v1
Provided by: HAL-SUPELEC
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