Article thumbnail
Location of Repository

Atomic force microscopy imaging of transition metal layered compounds: A two-dimensional stick–slip system

By J. Kerssemakers and J.Th.M. De Hosson

Abstract

Various layered transition metal dichalcogenides were scanned with an optical-lever atomic force microscope (AFM). The microscopic images indicate the occurrence of strong lateral stick–slip effects. In this letter, two models are presented to describe the observations due to stick–slip, i.e., either as a static or as a dynamic phenomenon. Although both models describe correctly the observed shapes of the unit cell, details in the observed and simulated images point at dynamic nonequilibrium effects. This exact shape of the unit cell depends on cantilever stiffness, scan direction, and detector direction.

Year: 1995
DOI identifier: 10.1063/1.115440
OAI identifier: oai:ub.rug.nl:dbi/4548c5cd4f6c8
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://zernike.eldoc.ub.rug.nl... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.