microscopy techniques III&quot;.

Adrian P. Nievergelt; Jonathan D. Adams; Pascal D. Odermatt; Georg E. Fantner; Adrian P. Nievergelt; Jonathan D. Adams; Pascal D. Odermatt; Georg E. Fantner; Beilstein J. Nanotechnol; T. Glatzel

oai:CiteSeerX.psu:10.1.1.984.5374

microscopy techniques III".

Authors: Adrian P. Nievergelt
Jonathan D. Adams
Pascal D. Odermatt
Georg E. Fantner
Adrian P. Nievergelt
Jonathan D. Adams
Pascal D. Odermatt
Georg E. Fantner
Beilstein J. Nanotechnol
T. Glatzel
Publication date: January 1, 2014
Publisher

Abstract

atomic force microscopy; multifrequency imaging; nanomechanical characterization; photothermal excitation; small cantilever

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