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Autonomously detecting the defective pixels in an imaging sensor array using a robust statistical technique

By Siddhartha Ghosh, Ian W. Marshall and Alex A. Freitas

Abstract

We propose a statistical technique for autonomously detecting defective pixels in a CCD sensor array. Our data-driven analysis technique can autonomously identify a wide range of faulty and 'suspect' pixels (hypo-sensitive or hyper-sensitive pixels), without the need for any defect model or prior knowledge of the nature of pixel faults. We apply our technique to the autonomous detection of the defective pixels in regular images captured with a camera, equipped with a CCD

Topics: QA76
Publisher: SPIE-INT SOC OPTICAL ENGINEERING
Year: 2008
DOI identifier: 10.1117/12.765147
OAI identifier: oai:kar.kent.ac.uk:24051
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