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Active correction of the tilt angle of the surface plane with respect to the rotation axis during azimuthal scan

By M. Sereno, S. Lupone, M. Debiossac, N. Kalashnyk and Philippe Roncin

Abstract

International audienceA procedure to measure the residual tilt angle τ between a flat surface and the azimuthal rotation axis of the sample holder is described. When the incidence angle θ and readout of the azimuthal angle ϕ are controlled by motors, an active compensation mechanism can be implemented to reduce the effect of the tilt angle during azimuthal motion. After this correction, the effective angle of incidence is kept fixed, and only the small residual oscillation of the scattering plane remains

Topics: grazing incidence, surface science, fast atom diffraction, triangulation, [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph]
Publisher: Elsevier
Year: 2016
DOI identifier: 10.1016/j.nimb.2016.05.001
OAI identifier: oai:HAL:hal-01616595v1
Provided by: HAL Mines Nantes
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