oaioai:CiteSeerX.psu:10.1.1.572.9916

nt Transmission electron microscopy (TEM)

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    Publication date
    March 15, 2015
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    Abstract

    part ail sing ic S rfac en nism an only s can Si (mc-minan ed to ls. cated molte (2) SiC filaments mostly growing at grain boundaries of mc-Si is to f SiC tions ross-section of the interface between the filaments and the matrix ar

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    oaioai:CiteSeerX.psu:10.1.1.572.9916Last time updated on 10/29/2017

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