oaioai:CiteSeerX.psu:10.1.1.570.6484

Robust analog design for automotive applications by design centering with safe operating areas

Abstract

The effects of random variations during the manufacturing process on devices can be simulated as a variation of tran-sistor parameters. Device degradation, due to temperature or voltage stress, causes a shift of device parameters, for ex-ample threshold voltage Vth, which can also be modeled as a degradation of transistor parameters. Therefore, in order to design circuits, which are robust and reliable, analysis and optimization of their sensitivity to variations in model parameters is important. Furthermore, constraints on the operating regions and voltage differences of transistors are used in order to keep operating points stable over a large temperature range. In this work, using two circuits for au-tomotive applications and current process development kits (PDK), we show how design centering software can be used to consider both sensitivity reduction towards model param-eter variation and constraints to control safe operating ar-eas (SOA). Beyond that a comparison of the constraint ma-trix method with two established methods of SOA checking is done

Similar works

Full text

thumbnail-image
oaioai:CiteSeerX.psu:10.1.1.570.6484Last time updated on 10/29/2017

This paper was published in CiteSeerX.

Having an issue?

Is data on this page outdated, violates copyrights or anything else? Report the problem now and we will take corresponding actions after reviewing your request.