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silicon dioxide by means

By J. W. Swart, J. A. Diniz, I. Doi and M. A. B. De Moraes

Abstract

of the refractive index and the dielectric constant o

Topics: Dielectric constant, Ion implantation, Silicon oxide
Year: 2014
OAI identifier: oai:CiteSeerX.psu:10.1.1.485.9261
Provided by: CiteSeerX
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