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This is an update request for the document Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy
by Kevin R. Bagnall, Elizabeth A. Moore, Stefan C. Badescu, Lenan Zhang and Evelyn N. Wang
Your paper was deposited in MUCC (Crossref)
and appears online at http://aip.scitation.org/doi/am-pdf/10.1063/1.5010225
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