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This is an update request for the document Low frequency noise statistical characterization of 14nm FDSOI technology node
by E. Ioannidis, C. Theodorou, S. Haendler, M.-K. Joo, E. Josse, C. Dimitriadis and G. Ghibaudo
Your paper was deposited in Hal - Université Grenoble Alpes
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